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  1. Home
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  5. Temperature effects on electrical and structural properties of MEH-PPV/PEIE OLED Device
 
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Temperature effects on electrical and structural properties of MEH-PPV/PEIE OLED Device

Journal
Journal of Physics: Conference Series
ISSN
17426588
Date Issued
2020-06-16
Author(s)
Nurul Afiqah Nor Ismail
Universiti Malaysia Perlis
Safizan Shaari
Universiti Malaysia Perlis
Mohd Fairus Ahmad
Universiti Malaysia Perlis
Norhayati Sabani
Universiti Malaysia Perlis
Nurjuliana Juhari
Universiti Malaysia Perlis
Nor Farhani Zakaria
Universiti Malaysia Perlis
DOI
10.1088/1742-6596/1535/1/012020
Abstract
This paper explores the performance of configuration ITO/MEH-PPV/PEIE/Al OLED under the variations of temperature. The MEH-PPV and MEH-PPV/PEIE thin film were deposited on ITO substrates using spin coating technique with fixed spin speed of 3000 rpm and baked at low temperature ranging from 90 °C to 180 °C, respectively. The surface roughness values for MEH-PPV and MEH-PPV/PEIE films were analysed using AFM with 5 μm ' 5 μm scanning area. The roughness of MEH-PPV thin films were reduced from 2.825 nm to 1.625 nm when temperature increased. Contrary to MEH-PPV/PEIE films where the roughness increased linearly up to 3.397 nm when the temperature increased. The maximum absorption peak spectrum obtained from UV-Visible (UV-Vis) was found at 500 nm to 510 nm when baked temperature were varied. Furthermore, the turn on voltage from J-V characteristics gives no specific pattern across different temperature and agreed with the trend of surface roughness values. The turn-on voltage at T = 150 °C gives the lowest value of 3 V. Overall, the variations of low temperature gives an effects on structural and electrical properties of this OLED configuration.
File(s)
research repository notification.pdf (4.4 MB)
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Nov 19, 2024
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Nov 19, 2024
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