Nor Farhani Zakaria
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Preferred name
Nor Farhani Zakaria
Official Name
Nor Farhani, Zakaria
Alternative Name
Zakaria, N. Fa
Zakaria, N. F.
Zakaria, N.
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Scopus Author ID
57191032557
Researcher ID
AFT-7132-2022

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  • Publication
    Optimization of MEH-PPV based single and double-layer TOLED structure by numerical simulation
    ( 2021-12)
    T. Kersenan
    ;
    Nor Farhani Zakaria
    ;
    Safizan Shaari
    ;
    Norhayati Sabani
    ;
    Nurjuliana Juhari
    ;
    Meor Ahmad Faris bin Meor Ahmad Tajudin
    ;
    A.F.A Rahim
    In this work, we simulated and characterized Poly [2-methoxy-5-(2’-ethylhexyloxy)-1, 4-phenylene vinylene] (MEH-PPV) based single and double-layer TOLED by using Silvaco ATLAS device simulator to achieve prominent values of electrical and optical properties of the device. MEH-PPV were used as the emitting layer (EML) in the single-layer, while addition of Poly [(3,4-ethylene dioxythiophene)-poly(styrene sulfonate)] (PEDOT-PSS) as the electron transport layer (ETL) were conducted in double-layer TOLED simulation. The EML and ETL thickness in both structures were varied between 10 – 150 nm, respectively, to observe and understand the underlying physics of the relation in the layer thickness to the electrical and optical characteristics. Furthermore, variation of the EML/ETL thickness ratio from 1:1 to 5:1 (with thickness in between 10 to 50 nm) had also been conducted. From this work, it is understood that the thickness of the EML layer plays the most important role in TOLED, and by balancing the carrier injections and recombination rate in appropriate EML/ETL thickness ratio, the electrical and optical properties can be improved. By optimizing the EML/ETL thickness and thickness ratio, an optimal forward current of 1.41 mA and luminescent power of 1.93e-18 W/μm has been achieved with both MEH-PPV and PEDOT-PSS layer thickness of 10 nm (1:1 ratio), respectively. The results from this work will assist the improvement of TOLED device to be implemented widely in low power and transparent electronic appliances.
  • Publication
    Rectification performance of self-switching diodes in silicon substrate using device simulator
    (Institute of Electrical and Electronics Engineers (IEEE), 2017-01-03)
    Zarimawaty Zailan
    ;
    Shahrir Rizal Kasjoo
    ;
    Nor Farhani Zakaria
    ;
    Muammar Mohamad Isa
    ;
    Mohd Khairuddin Md Arshad
    ;
    Sanna Taking
    A planar nanodevice, known as the self-switching diode (SSD) has been demonstrated to rectify electromagnetic signals at microwave and terahertz frequencies. This diode has a non-linear current-voltage (I-V) characteristic due to the structure of the device which consists of asymmetric nanochannel. To further explore the properties of SSD rectifiers, in this work, silicon-based SSDs with different dielectric materials that filled up the trenches of the devices were simulated using ATLAS device simulator under the temperature range of 250 K-500 K. The results showed that the rectification performance of the SSDs was deteriorated with increasing temperature for all dielectric materials which might be due to the thermal-activated electronic transport behavior of the devices.
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