This paper investigates the performance of the uniformity and absorption spectrum of MEHPPV+PEIE thin films also the electrical properties for configuration of ITO/PEDOT: PSS/MEH+PEIE/Al. The sample used 0.5 wt % of PEDOT: PSS solution while 5 mgml-1 concentration of MEH-PPV solution was doped with four different concentrations of PEIE with values of 0.1 wt%, 0.3 wt%, 0.5 wt% and 0.7 wt% respectively. The untreated PEDOT: PSS and MEH-PPV+PEIE was deposited using spin coating technique at a fixed spun speed of 3000 rpm to obtain smooth surface roughness thin film. The root mean square (RMS) value, absorption spectrum and current density (A/cm-2) of the PEDOT: PSS and MEH-PPV+PEIE films were analyzed using Atomic Force Microscope (AFM), UV-Visible (UV-Vis) Spectrophotometer and Semiconductor Parametric Analyzer (SPA), respectively. The surface roughness of the films were linearly increased when the dopant concentration increased with the maximum RMS value of ∼4.74 nm. Besides, absorption peak wavelength also was red-shifted from 500 nm to 551 nm under an influence of PEIE dopant concentrations. However, the turn on voltage gives no significant trend when dopant concentration was increased but the emission of the light was emitted when the voltage was below 8 V. Among four different dopant concentrations of MEH-PPV+PEIE, the brighter light emission was observed at 0.3 wt% of PEIE. Apparently, the concentration of dopant solution gives a significant contribution to the performance of OLED in terms of structural, optical and electrical properties.
