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  1. Home
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  5. Investigation of Scribing Quality Defect of Thin Film Solar Cell Using Machine Vision
 
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Investigation of Scribing Quality Defect of Thin Film Solar Cell Using Machine Vision

Journal
IOP Conference Series: Materials Science and Engineering
ISSN
17578981
Date Issued
2020-12-18
Author(s)
Shuaimi R.
Kulim Hi-Tech Park, Kedah
Rizalafande Che Ismail
Universiti Malaysia Perlis
Hazwan Hadzir M.N.
Universiti Kuala Lumpur
Mohd Annuar Mohd Isa
Universiti Malaysia Perlis
Asral Bahari Jambek
Universiti Malaysia Perlis
DOI
10.1088/1757-899X/932/1/012060
Handle (URI)
https://iopscience.iop.org/article/10.1088/1757-899X/932/1/012060/pdf
https://iopscience.iop.org/article/10.1088/1757-899X/932/1/012060
Abstract
Laser micromachining provide significant effect in thin film solar industrial field especially in determining cell efficiency of each panels. However, there is an issue in determining scribing failure or defect on solar module. This research aims to investigate the defects of laser micromachining process in thin film solar module in manufacturing fields. Machine vision inspection system is used as inspection tools and to investigate the defect of laser micromachining in thin film solar cells. As a result, two major defects is define which is scribe line quality and scribe line position defects in every scribe line. By identifying the defect cause by laser micromachining through machine vision, quality control plan can be taken together to prevent reoccurrence.
File(s)
Investigation of Scribing Quality Defect of Thin Film Solar Cell Using Machine Vision.pdf (57.9 KB)
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