Kamrosni Abdul Razak
Thumbnail Image
Preferred name
Kamrosni Abdul Razak
Official Name
Razak, Kamrosni Abdul
Alternative Name
Abdul Razak, Kamrosni
Razak, K. Abdul
Razak, Kamrosni Ab
Razak, Kamrosni Abdul
Razak, K. A.
Abdul Razak, K.
K., Abdul Razak
Main Affiliation
Scopus Author ID
57207592874
Researcher ID
DNW-1117-2022

Research Output

Filters
1
Reset filters

Settings
Now showing 1 - 1 of 1
  • Publication
    Microstructural studies of Ag/TiO2 thin film; effect of annealing temperature
    ( 2021)
    Kamrosni Abdul Razak
    ;
    C.H. Dewi Suryani
    ;
    A. Azliza
    ;
    Mohd. Mustafa Al Bakri Abdullah
    ;
    Mohd Arif Anuar Mohd Salleh
    ;
    Norsuria Mahmed
    ;
    V. Chobpattana
    ;
    L. Kaczmarek
    ;
    B. Jeż
    ;
    M. Nabiałek
    Microstructures are an important link between materials processing and performance, and microstructure control is essential for any materials processing route where the microstructure plays a major role in determining the properties. In this work, silverdoped titanium dioxide (Ag/TiO2) thin film was prepared by the sol-gel method through the hydrolysis of titanium tetra-isopropoxide and silver nitrate solution. The sol was spin coated on ITO glass substrate to get uniform film followed by annealing process for 2 hours. The obtained films were annealed at different annealing temperatures in the range of 300°C-600°C in order to observe the effect on crystalline state, microstructures and optical properties of Ag/TiO2 thin film. The thin films were characterized by X-Ray diffraction (XRD), scanning electron microscopy (SEM), and UV-Vis spectrophotometry. It is clearly seen, when the annealing temperature increases to 500°C, a peak at 2θ = 25.30° can be seen which refers to the structure of TiO2 tetragonal anatase. The structure of Ag/TiO2 thin film become denser, linked together, porous and uniformly distributed on the surface and displays the highest cut-off wavelength value which is 396 nm with the lowest band gap value, which is 3.10 eV. Keywords: Ag/TiO2; Annealing Temperature; Microstructure; Optical Properties; Thin Film
      7  31