Study of intersubband transitions in Si1-xGex/Si quantum wells using 14-band k×p model
Journal
International Journal of Nanoelectronics and Materials (IJNeaM)
ISSN
1985-5761
Date Issued
2008-01
Author(s)
W. Liu
Nanyang Technological University
D. H. Zhang
Nanyang Technological University
T. H. Loh
Institute of Microelectronics
W.J. Fan
Nanyang Technological University
S. F. Yoon
Nanyang Technological University
N. Balasubramanian
Institute of Microelectronics
Abstract
Optical intersubband transitions (ISTs) for both in-plane polarization (TE) and normalto-plane polarization (TM) in p-type Si1-xGex/Si multiple quantum wells (MQWs) are investigated using 14-band k⋅p model combined with the envelope-function Fourier expansion method. The results show that the amplitudes of different intersubband transitions for TE and TM polarizations, and the overall absorption vary regularly with the well width as it affects the distribution of bound and continuum excited states directly, and TE mode absorption dominates in all the QWs studied. This work provides useful information for design and analysis of Si1-xGex/Si quantum well infrared photodetectors (QWIPs).