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  4. International Journal of Nanoelectronics and Materials (IJNeaM)
  5. A review: properties of silicon carbide materials in MEMS application
 
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A review: properties of silicon carbide materials in MEMS application

Journal
International Journal of Nanoelectronics and Materials (IJNeaM)
ISSN
1985-5761
Date Issued
2020-12
Author(s)
Noraini Marsi
Universiti Tun Hussein Onn Malaysia
Burhanuddin Yeop Majlis
Universiti Kebangsaan Malaysia
Faisal Mohd-Yassin
Griffith University, Australia
Hafzaliza Erny Zainal Abidin
Universiti Kebangsaan Malaysia
Azrul Azlan Hamzah
Universiti Kebangsaan Malaysia
Handle (URI)
https://ijneam.unimap.edu.my/
https://ijneam.unimap.edu.my/images/PDF/Special%20Isssue%20IJNeaM%20(Disember%202020)/Vol_13_SI_Dec2020_113-128.pdf
https://hdl.handle.net/20.500.14170/15293
Abstract
The paper presents the review properties of silicon carbide materials in the MEMS application. The study aims to explore silicon carbide in MEMS technology which considers the development of microscale and integrated devices that combine electronics, electrical and mechanical elements. MEMS has become a key area micro-device technology which incorporates materials, mechanical, electrical, chemical and optical disciplines as well as fluid engineering. The prevalence of MEMS technology in harsh environments has grown tremendously in recent years, especially at high temperatures up to 1240˚C, wider bandgap (2.3 – 3.4 eV), a higher breakdown field (30 × 105 V/cm), a higher thermal conductivity (3.2 – 4.9 W/cm- K), a higher saturation velocity (2.5 × 107 cm/s), higher oxidation, corrosive environments and higher radiation. Recent developments in robust MEMS for extreme environments such as MEMS pressure sensors have been widely used in ships, warships, gas turbine engines, cars and biomedical equipment. The growing demand for MEMS pressure sensors with high-temperature operating capabilities, mainly for automotive, gas turbine engine and aerospace applications was investigated from this study as alternative silicon carbide to silicon in the fabrication of these devices.
Subjects
  • MEMS

  • Silicon carbide

  • High temperature

  • Radiation

  • Sensor

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A Review: Properties of Silicon Carbide Materials (833.47 KB)
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