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  4. International Journal of Nanoelectronics and Materials (IJNeaM)
  5. Electric field distribution in weakly absorbing monolayer at oblique incidence of light
 
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Electric field distribution in weakly absorbing monolayer at oblique incidence of light

Journal
International Journal of Nanoelectronics and Materials (IJNeaM)
ISSN
1985-5761
Date Issued
2013-07
Author(s)
Nadir F. Habubi
Al-Mustansiryah University
Khudheir A. Mishjil
Al-Mustansiryah University
Hayfa G. Rashid
Al-Mustansiryah University
Hazim L. Mansour
Al-Mustansiryah University
Handle (URI)
https://ijneam.unimap.edu.my/
https://ijneam.unimap.edu.my/images/PDF/IJNEAM%20No.%202%202013/IJNEAM%206_No%202_2_87-95.pdf
https://hdl.handle.net/20.500.14170/2516
Abstract
Calculation of the electric filed intensity of light incident obliquely on a single layer of SnO2 thin-film coating of weakly absorbing material is presented. The analysis utilizes matrix formulas based on Abele's formulas from the calculation of reflectance and transmittance. Partial absorption due to a certain depth in the prepared film by using chemical spray pyrolysis technique was also investigated. The present study offers a useful tool in the understanding of the mechanism of light absorption in many applications, and it is convenient to use intensity of the visible and near infrared spectrum are of interest.
Subjects
  • Electric field intens...

  • Matrix formulas

  • Reflection spectrosco...

  • Spray pyrolysis techn...

File(s)
Electric field distribution in weakly absorbing monolayer at oblique incidence of light.pdf (453.06 KB)
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