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  5. Reliability analysis and power dissipation of quantum dot cellular automata circuits for next generation computing
 
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Reliability analysis and power dissipation of quantum dot cellular automata circuits for next generation computing

Journal
International Journal of Nanoelectronics and Materials (IJNeaM)
ISSN
1985-5761
Date Issued
2019-10
Author(s)
R. Jayalakshmi
Sri Chandrasekharendra Saraswathi Viswa Maha Vidyalaya, Tamil Nadu, India
M. Senthil Kumaran
Sri Chandrasekharendra Saraswathi Viswa Maha Vidyalaya, Tamil Nadu, India
Handle (URI)
https://ijneam.unimap.edu.my/
https://ijneam.unimap.edu.my/images/PDF/IJNEAM%20OCT%20FINAL/Vol_12_No_4_2019_11_485-494.pdf
https://hdl.handle.net/20.500.14170/15549
Abstract
Quantum Dot Cellular Automata (QCA), an emerging Field Coupled Nano computing which is the new paradigm of computation has to be analyzed for reliability and thermal stability and power dissipation. The main focus of this study is to analyze a high input majority voter based on 3 to 8 decoder for reliability using Bayesian network at a circuit level. The charge configuration flow indicated the reliability of the data transmitted and hence the behavior of the QCA Circuits was analyzed. The Casual Direct Acrylic graph was used to analyze the behavior of QCA circuits. The power dissipation of the QCA circuits was also analyzed using QCADesigner-E tool. Bayesian networks were generated using dagitty tool.
Subjects
  • Quantum dot cellular ...

  • QCA Designer

  • Dagitty

  • QCA designer E

File(s)
Reliability Analysis and Power Dissipation (808.28 KB)
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