Simulation of electromagnetic wave propagation on layered metal-dielectric structures using analytical methods is a study that continues to be developed because it involves strict mathematical equations with exact results. In this study, the transfer matrix method was developed to analyze the dielectric-metal-metal-dielectric structure through the reflection profile. The emergence of the Surface Plasmons Resonance (SPR) phenomenon causes a minimum reflectance whose changes are analyzed through variations in optical and physical parameters. The simulation shows that the minimum reflectance angle occurs at an angle 𝜃𝜃=850, indicating the existence of the SPR phenomenon in the condition 𝜔𝜔/𝜔𝜔0=0.9. The choice of metal materials, namely gold and silver, resulted in a shift in the reflectance curve, and an increase in the thickness of the adhesive layer caused a shift in the reflectance curve towards a smaller angle. Changes in the refractive index of the upper dielectric material are important for biosensor development, namely a shift in the reflectance curve with a linear response at the interval of refractive index 2.61−2.91.
