Aimi Noorliyana Hashim
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Preferred name
Aimi Noorliyana Hashim
Official Name
Aimi Noorliyana, Hashim
Alternative Name
Hashim, Aimi Noorliyana
Noorliyana Hashim, Aimi
Noorliyana, H. Aimi
Aimi Noorliyana, H.
Main Affiliation
Scopus Author ID
57060477400
Researcher ID
HSY-2766-2023

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  • Publication
    Tin whiskers formation in Sn₀.₇Cu₀.₀₅Ni₁.₅Bi under electro-migration stressing
    (Institute of Physics, Polish Academy of Sciences (PAS), 2020)
    N.Z.M. Mokhtar
    ;
    Mohd Arif Anuar Mohd Salleh
    ;
    G.M. Zhang
    ;
    D.M. Harvey
    ;
    M. Nabialek
    ;
    Aimi Noorliyana Hashim
    ;
    S.F. Nazri
    Stress induced by electrical current testing indeed has caused the formation of many whiskers growth in soldering applications. The aim of this investigation is to investigate the electrical current testing to the formation of whiskers. Also the mitigation could be achieved with the additional element of Nickel-Bismuth (Ni–Bi). Characterization of whisker growths are evaluated using the Scanning Electron Microscopy (SEM) on the deposits near anode and cathode areas. Synchrotron micro-XRF were performed on Sn₀.₇Cu₀.₀₅Ni₁.₅Bi at anode and cathode to accurately observe the distributions of elements in the sample. The obtained results demonstrate that the whisker growths with the effect of current stressing is associated with the intermetallic compound (IMCs) thickness on the anode and cathode areas. Finding shows that by addition of Ni-Bi elements can help to reduce the amount of whiskers form by refining the IMCs formation.