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  1. Home
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  5. Controlling porosity during transient liquid phase bonding for high-temperature soldering processes
 
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Controlling porosity during transient liquid phase bonding for high-temperature soldering processes

Journal
2023 International Conference on Electronics Packaging, ICEP 2023
Date Issued
2023-01-01
Author(s)
Nurul Razliana Abdul Razak
Universiti Malaysia Perlis
Tan X.F.
McDonald S.D.
Bermingham M.J.
Venezuela J.
Nishimura T.
Nogita K.
DOI
10.23919/ICEP58572.2023.10129722
Abstract
Exploiting the growth rate dependency of intermetallic compounds (IMCs) on the substrate composition, the possibility of controlling porosity during transient liquid phase (TLP) bonding via a composition gradient is investigated. A Cu substrate with a variable Ni concentration was prepared through selective electroplating and subsequent heat treatment. When this substrate reacted with a molten Sn-rich alloy, there was a non-uniform growth of the Cu6Sn5 IMC. It is proposed that by tailoring the direction of the composition gradient in the substrate, the IMC growth rate can be controlled in such a way as to progressively move the solid-liquid front to redistribute any porosity away from the central region of the joint and thereby improve reliability.
Funding(s)
Australian Research Council
Subjects
  • Electronics packaging...

File(s)
research repository notification.pdf (4.4 MB)
Views
1
Acquisition Date
Nov 19, 2024
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