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Novel march WY approach for dynamic fault detection in memory BIST

2024-01 , Wan Ying Loh , Weng Fook Lee , Razaidi Hussin , Aiman Zakwan Jidin , Norhawati Ahmad , Nor Azura Zakaria

Dynamic fault detection has shown an increasingly important role in the DPM level for embedded memories in SoC. Memory testing is directly related to the reliability of the whole SoC since embedded memories occupy a large area in the SoC and are used to store data for application usage. However, it is essential to bring down the test complexity of the March-based test algorithm for dynamic fault detection to maintain the test time and expenses within an acceptable economic range. March WY1 (66n) is proposed as the minimal March algorithm targeting unlinked two-operation single-cell dynamic faults and double-cell faults of types Sw and Saa to enhance the test efficiency for dynamic fault detection in SRAM. The proposed March WY1 (66n) has reduced test complexity by 4n compared to the well-known March MD2 (70n) while maintaining the same 100% dynamic fault coverages.

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A new 13N-complexity memory built-in self-test algorithm to balance static random access memory static fault coverage and test time

2025-02 , Aiman Zakwan Jidin , Razaidi Hussin , Mohd Syafiq Mispan , Lee Weng Fook

As memories dominate the system-on-chip (SoC), their quality significantly impacts the chip manufacturing yield. There is a growing need to reduce the chip production time and cost, which mainly depends on the testing phase. Hence, a memory built-in self-test (MBIST) utilizing a low-complexity, high-fault-coverage test algorithm is essential for efficient and thorough memory testing. The March AZ1 algorithm, with 13N complexity, was created earlier to balance the test length and fault coverage. However, poor positioning of a write operation in its test sequence caused the reduction of the transition coupling fault (CFtr) detection. This paper presents the creation of the March AZ algorithm, modified from the March AZ1 algorithm, to increase CFtr coverage while preserving the same complexity. It was accomplished by analyzing the fault coverage offered by the March AZ1 algorithm and then reorganizing its test sequence to address the limitation in detecting CFtr. The newly produced March AZ1 algorithm was successfully implemented in an MBIST controller. The simulation tests validated its functionality and demonstrated that the CFtr coverage was enhanced from 62.5% to 75%, achieving an overall fault coverage of 83.3%. Therefore, with 13N complexity, it offers the best fault coverage among all the existing test algorithms with a complexity below 18N.