Ayu Wazira Azhari
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Ayu Wazira Azhari
Official Name
Ayu Wazira, Azhari
Alternative Name
Ayu, A. W.
Azhari, Ayu W.
Main Affiliation
Scopus Author ID
24450001400
Researcher ID
ABA-7808-2020

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  • Publication
    Effect of temperature and amount of Ag on TiO₂ thin film synthesised via sol–gel method
    (Springer, 2025-02)
    Dewi Suriyani Che Halin
    ;
    Kamrosni Abdul Razak
    ;
    Dharshini Karikalan
    ;
    Lukasz Kaczmarek
    ;
    Sebastian Miszczak
    ;
    Ayu Wazira Azhari
    ;
    Mohd Arif Anuar Mohd Salleh
    ;
    Nur Izzati Muhammad Nadzri
    ;
    Juyana A. Wahab
    ;
    Mohd. Mustafa Al Bakri Abdullah
    TiO₂ sol was produced via the sol–gel method with different amounts of AgNO₃ as the source of Ag. The Ag/TiO₂ thin film was obtained by spin coating and was annealed at various annealing temperatures (300°C, 400°C and 500°C) for 1 h. The effect of different amounts of AgNO₃ and different annealing temperatures on the TiO₂ thin films was studied by characterising the phase composition, surface morphology and water contact angle. Results from the x-ray diffraction (XRD) pattern show that with the addition of AgNO₃, Ag/TiO₂ can be formed at low annealing temperatures (300°C). At increased annealing temperatures (400°C and 500°C) and amounts of AgNO₃ (1.0 ml and 1.5 ml), Ag₂O and Ag₃O4 phases were observed. Flakes or flaky islands were formed on the thin film due to thermal expansion mismatch between the film and substrate, residual stress within the film or the release of volatile species when annealed at a low temperature of ⁓300°C. Increasing the temperature to 500°C resulted in the growth and coalescence of the flaky islands by the surface diffusion of adsorbed atoms (adatoms) and their annexation to the surface of existing nuclei. The water contact angle provides valuable insight into the surface interactions between water droplets and the surface of Ag/TiO₂ thin films. It was found that at 1.5 ml AgNO₃, the increased annealing temperature from 300°C to 500°C decreased the water contact angle of Ag/TiO₂ thin films from 83.86° to 34.62°, forming superhydrophilic properties, which indicated its excellent potential as a photocatalyst.
  • Publication
    Microstructure evolution of Ag/TiO₂ thin film
    ( 2021)
    Dewi Suriyani Che Halin
    ;
    Kamrosni Abdul Razak
    ;
    Mohd Arif Anuar Mohd Salleh
    ;
    Mohd Izrul Izwan Ramli
    ;
    Mohd. Mustafa Al Bakri Abdullah
    ;
    Ayu Wazira Azhari
    ;
    Kazuhiro Nogita
    ;
    Hideyuki Yasuda
    ;
    Marcin Nabiałek
    ;
    Jerzy J. Wysłocki
    Ag/TiO₂ thin films were prepared using the sol-gel spin coating method. The microstructural growth behaviors of the prepared Ag/TiO₂ thin films were elucidated using real-time synchrotron radiation imaging, its structure was determined using grazing incidence X-ray diffraction (GIXRD), its morphology was imaged using the field emission scanning electron microscopy (FESEM), and its surface topography was examined using the atomic force microscope (AFM) in contact mode. The cubical shape was detected and identified as Ag, while the anatase, TiO₂ thin film resembled a porous ring-like structure. It was found that each ring that coalesced and formed channels occurred at a low annealing temperature of 280 °C. The energy dispersive X-ray (EDX) result revealed a small amount of Ag presence in the Ag/TiO₂ thin films. From the in-situ synchrotron radiation imaging, it was observed that as the annealing time increased, the growth of Ag/TiO₂ also increased in terms of area and the number of junctions. The growth rate of Ag/TiO₂ at 600 s was 47.26 µm2/s, and after 1200 s it decreased to 11.50 µm2/s and 11.55 µm2/s at 1800 s. Prolonged annealing will further decrease the growth rate to 5.94 µm2/s, 4.12 µm2/s and 4.86 µm2/s at 2400 s, 3000 s and 3600 s, respectively.
      3  17
  • Publication
    Effect of polyethylene glycol and sodium dodecyl sulphate on microstructure and self-cleaning properties of graphene oxide/TiO2 thin film
    ( 2020-09-01)
    Azani A.
    ;
    Dewi Suriyani Che Halin
    ;
    Kamrosni Abdul Razak
    ;
    Mohd. Mustafa Al Bakri Abdullah
    ;
    Norsuria Mahmed
    ;
    Muhammad Mahyiddin Ramli
    ;
    Mohd Arif Anuar Mohd Salleh
    ;
    Mohd Fairul Sharin Abdul Razak
    ;
    Ayu Wazira Azhari
    ;
    Chobpattana V.
    ;
    Kaczmarek L.
    In this study, a sol gel procedure for preparation of TiO2 thin films with graphene oxide (GO) was developed. The effect of PEG and SDS addition on the microstructure of the films as well as the photocatalytic activity of the thin film was also investigated. The morphology and surface structure of the films were studied by SEM and AFM while the photocatalytic activity of the films was analyzed by measuring the degradation of methylene blue under sunlight irradiation using UV-Vis spectrophotometer. It was found that GO/TiO2 thin film with PEG shows a smaller and porous particle while GO/TiO2 thin film with SDS formed a very smooth surface and very fine particles. Therefore, in AFM analysis reveals that surface roughness decreases with the addition of PEG and SDS. Finally, the photocatalytic activity showed that GO/TiO2 thin film with SDS have the most effective self-cleaning property which degrade 64% of methylene blue that act as model of contaminants.
      1
  • Publication
    Microstructure evolution of ag/tio2 thin film
    ( 2021-01-01)
    Dewi Suriyani Che Halin
    ;
    Kamrosni Abdul Razak
    ;
    Mohd Izrul Izwan Ramli
    ;
    Mohd Arif Anuar Mohd Salleh
    ;
    Mohd. Mustafa Al Bakri Abdullah
    ;
    Ayu Wazira Azhari
    ;
    Nogita K.
    ;
    Yasuda H.
    ;
    Nabiałek M.
    ;
    Wysłocki J.J.
    Ag/TiO2 thin films were prepared using the sol-gel spin coating method. The microstruc-tural growth behaviors of the prepared Ag/TiO2 thin films were elucidated using real-time syn-chrotron radiation imaging, its structure was determined using grazing incidence X-ray diffraction (GIXRD), its morphology was imaged using the field emission scanning electron microscopy (FESEM), and its surface topography was examined using the atomic force microscope (AFM) in contact mode. The cubical shape was detected and identified as Ag, while the anatase, TiO2 thin film resembled a porous ring-like structure. It was found that each ring that coalesced and formed channels occurred at a low annealing temperature of 280◦C. The energy dispersive X-ray (EDX) result revealed a small amount of Ag presence in the Ag/TiO2 thin films. From the in-situ synchrotron radiation imaging, it was observed that as the annealing time increased, the growth of Ag/TiO2 also increased in terms of area and the number of junctions. The growth rate of Ag/TiO2 at 600 s was 47.26 µm2/s, and after 1200 s it decreased to 11.50 µm2/s and 11.55 µm2/s at 1800 s. Prolonged annealing will further decrease the growth rate to 5.94 µm2/s, 4.12 µm2/s and 4.86 µm2/s at 2400 s, 3000 s and 3600 s, respectively.
      4  2
  • Publication
    Microstructure evolution of Ag/TiO2 thin film
    ( 2021)
    Dewi Suriyani Che Halin
    ;
    Kamrosni Abdul Razak
    ;
    Mohd Arif Anuar Mohd Salleh
    ;
    Mohd Izrul Izwan Ramli
    ;
    Mohd. Mustafa Al Bakri Abdullah
    ;
    Ayu Wazira Azhari
    ;
    Kazuhiro Nogita
    ;
    Hideyuki Yasuda
    ;
    Marcin Nabiałek
    ;
    Jerzy J. Wysłocki
    Ag/TiO2 thin films were prepared using the sol-gel spin coating method. The microstructural growth behaviors of the prepared Ag/TiO2 thin films were elucidated using real-time synchrotron radiation imaging, its structure was determined using grazing incidence X-ray diffraction (GIXRD), its morphology was imaged using the field emission scanning electron microscopy (FESEM), and its surface topography was examined using the atomic force microscope (AFM) in contact mode. The cubical shape was detected and identified as Ag, while the anatase, TiO2 thin film resembled a porous ring-like structure. It was found that each ring that coalesced and formed channels occurred at a low annealing temperature of 280 °C. The energy dispersive X-ray (EDX) result revealed a small amount of Ag presence in the Ag/TiO2 thin films. From the in-situ synchrotron radiation imaging, it was observed that as the annealing time increased, the growth of Ag/TiO2 also increased in terms of area and the number of junctions. The growth rate of Ag/TiO2 at 600 s was 47.26 µm2/s, and after 1200 s it decreased to 11.50 µm2/s and 11.55 µm2/s at 1800 s. Prolonged annealing will further decrease the growth rate to 5.94 µm2/s, 4.12 µm2/s and 4.86 µm2/s at 2400 s, 3000 s and 3600 s, respectively.
      20  1